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  • Journal article
    Saur J, Schilling N, Neubauer FM, Strobel DF, Simon S, Dougherty MK, Russell CT, Pappalardo RTet al., 2008,

    , GEOPHYSICAL RESEARCH LETTERS, Vol: 35, ISSN: 0094-8276
  • Journal article
    Horbury TS, Forman M, Oughton S, 2008,

    , PHYSICAL REVIEW LETTERS, Vol: 101, ISSN: 0031-9007
  • Journal article
    Moore L, Galand M, Mueller-Wodarg I, Yelle R, Mendillo Met al., 2008,

    , JOURNAL OF GEOPHYSICAL RESEARCH-SPACE PHYSICS, Vol: 113, ISSN: 2169-9380
  • Journal article
    Smillie DG, Pickering JC, Smith PL, 2008,

    , MONTHLY NOTICES OF THE ROYAL ASTRONOMICAL SOCIETY, Vol: 390, Pages: 733-740, ISSN: 0035-8711
  • Journal article
    Masters A, Achilleos N, Dougherty MK, Slavin JA, Hospodarsky GB, Arridge CS, Coates AJet al., 2008,

    , JOURNAL OF GEOPHYSICAL RESEARCH-SPACE PHYSICS, Vol: 113, ISSN: 2169-9380
  • Journal article
    Mueller-Wodarg ICF, Yelle RV, Cui J, Waite JHet al., 2008,

    , JOURNAL OF GEOPHYSICAL RESEARCH-PLANETS, Vol: 113, ISSN: 2169-9097
  • Journal article
    Yelle RV, Cui J, Mueller-Wodarg ICF, 2008,

    , JOURNAL OF GEOPHYSICAL RESEARCH-PLANETS, Vol: 113, ISSN: 2169-9097
  • Journal article
    West MJ, Bradshaw SJ, Cargill PJ, 2008,

    , SOLAR PHYSICS, Vol: 252, Pages: 89-100, ISSN: 0038-0938
  • Journal article
    Shen C, Liu Z, Escoubet CP, Carr CM, Reme H, Fazakerley A, Laakso H, Shi Q, Dandouras I, Zhang T, Wang S, Yang X, Dunlop M, Cao Jet al., 2008,

    , SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES, Vol: 51, Pages: 1639-1647, ISSN: 1006-9321
  • Journal article
    Duan S, Liu Z, Cao J, Lu L, Reme H, Dandouras I, Carr CMet al., 2008,

    , SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES, Vol: 51, Pages: 1721-1730, ISSN: 1006-9321
  • Journal article
    Li L, Cao J, Zhou G, Yang J, Yan C, Zhang T, Reme H, Dandouras I, Carr CMet al., 2008,

    , SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES, Vol: 51, Pages: 1695-1703, ISSN: 1006-9321
  • Journal article
    Zhang L, Shi J, Liu Z, Baumjohann W, Ma Z, Dunlop MW, Carr C, Reme Het al., 2008,

    , SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES, Vol: 51, Pages: 1704-1712, ISSN: 1006-9321
  • Journal article
    Yan G, Shen C, Liu Z, Dunlop M, Lucek E, Reme H, Carr CM, Zhang Tet al., 2008,

    , SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES, Vol: 51, Pages: 1677-1684, ISSN: 1006-9321
  • Journal article
    Bertucci C, Achilleos N, Dougherty MK, Modolo R, Coates AJ, Szego K, Masters A, Ma Y, Neubauer FM, Garnier P, Wahlund J-E, Young DTet al., 2008,

    , SCIENCE, Vol: 321, Pages: 1475-1478, ISSN: 0036-8075
  • Journal article
    Bunce EJ, Arridge CS, Clarke JT, Coates AJ, Cowley SWH, Dougherty MK, Gerard J-C, Grodent D, Hansen KC, Nichols JD, Southwood DJ, Talboys DLet al., 2008,

    , JOURNAL OF GEOPHYSICAL RESEARCH-SPACE PHYSICS, Vol: 113, ISSN: 2169-9380
  • Journal article
    Andrews DJ, Bunce EJ, Cowley SWH, Dougherty MK, Provan G, Southwood DJet al., 2008,

    , JOURNAL OF GEOPHYSICAL RESEARCH-SPACE PHYSICS, Vol: 113, ISSN: 2169-9380
  • Journal article
    Jackman CM, Forsyth RJ, Dougherty MK, 2008,

    , JOURNAL OF GEOPHYSICAL RESEARCH-SPACE PHYSICS, Vol: 113, ISSN: 2169-9380
  • Journal article
    艩m铆d P, Steers E, Weiss Z, Pickering J, Hoffmann Vet al., 2008,

    , Journal of Analytical Atomic Spectrometry, Vol: 23, Pages: 1223-1233, ISSN: 0267-9477

    It is now well known that traces of molecular gases such as hydrogen or nitrogen can affect significantly the electrical characteristics, sputtering rates and relative intensities of emission lines in glow discharge optical emission spectrometry (GD-OES). These changes, caused by the molecular gases which are very often present in the discharge for various reasons, have a serious impact on the accuracy of analytical results. Therefore, it is important to describe these effects in detail and to try to understand the processes involved. The results presented in this paper focus on the effects of hydrogen and nitrogen on intensities of atomic emission lines of iron and titanium. In the case of hydrogen, when intensity ratios (intensities measured in argon-hydrogen relative to those measured in pure argon) are plotted against the excitation energies of the lines, these intensity ratios increase with the excitation energy between approx. 3 and 5 eV for both elements studied. Furthermore, in the case of iron, several emission lines with the excitation energy between 5.3 and 5.6 eV are strongly enhanced in the presence of hydrogen. It has been also observed that this effect is more pronounced at lower currents. On the other hand, it has been found that nitrogen does not have any similar effect: the gradient of the intensity ratios of both elements is negligible or even negative and no emission lines are enhanced in the presence of nitrogen. A comparison was also made between direct current and radiofrequency powered glow discharges and very similar trends have been obtained. © 2008 The Royal Society of Chemistry.

  • Journal article
    Pauluis O, Czaja A, Korty R, 2008,

    , SCIENCE, Vol: 321, Pages: 1075-1078, ISSN: 0036-8075
  • Journal article
    Arridge CS, Khurana KK, Russell CT, Southwood DJ, Achilleos N, Dougherty MK, Coates AJ, Leinweber HKet al., 2008,

    , JOURNAL OF GEOPHYSICAL RESEARCH-SPACE PHYSICS, Vol: 113, ISSN: 2169-9380
  • Journal article
    Arridge CS, Andre N, Achilleos N, Khurana KK, Bertucci CL, Gilbert LK, Lewis GR, Coates AJ, Dougherty MKet al., 2008,

    , GEOPHYSICAL RESEARCH LETTERS, Vol: 35, ISSN: 0094-8276
  • Journal article
    Volwerk M, Lui ATY, Lester M, Walsh AP, Alexeev I, Cao X, Dunlop MW, Fazakerley AN, Grocott A, Kistler L, Lun X, Mouikis C, Pu Z, Shen C, Shi JK, Taylor MGGT, Baumjohann W, Nakamura R, Runov A, Voeroes Z, Zhang TL, Takada T, Reme H, Klecker B, Carr CMet al., 2008,

    , JOURNAL OF GEOPHYSICAL RESEARCH-SPACE PHYSICS, Vol: 113, ISSN: 2169-9380
  • Journal article
    Sundkvist D, Bale SD, 2008,

    , PHYSICAL REVIEW LETTERS, Vol: 101, ISSN: 0031-9007
  • Journal article
    Ergun RE, Malaspina DM, Cairns IH, Goldman MV, Newman DL, Robinson PA, Eriksson S, Bougeret JL, Briand C, Bale SD, Cattell CA, Kellogg PJ, Kaiser MLet al., 2008,

    , PHYSICAL REVIEW LETTERS, Vol: 101, ISSN: 0031-9007
  • Journal article
    Klimchuk JA, Patsourakos S, Cargill PJ, 2008,

    , ASTROPHYSICAL JOURNAL, Vol: 682, Pages: 1351-1362, ISSN: 0004-637X
  • Conference paper
    Mueller-Wodarg ICF, Strobel DF, Moses JI, Waite JH, Crovisier J, Yelle RV, Bougher SW, Roble RGet al., 2008,

    , Publisher: SPRINGER, Pages: 191-234, ISSN: 0038-6308
  • Journal article
    Fox JL, Galand MI, Johnson RE, 2008,

    , SPACE SCIENCE REVIEWS, Vol: 139, Pages: 3-62, ISSN: 0038-6308
  • Journal article
    Zhang L, Liu Z, Ma Z, Baumjohann W, Dunlop MW, Wang G, Wang X, Reme H, Carr Cet al., 2008,

    , CHINESE SCIENCE BULLETIN, Vol: 53, Pages: 2371-2375, ISSN: 1001-6538
  • Journal article
    Huestis DL, Bougher SW, Fox JL, Galand M, Johnson RE, Moses JI, Pickering JCet al., 2008,

    , SPACE SCIENCE REVIEWS, Vol: 139, Pages: 63-105, ISSN: 0038-6308
  • Conference paper
    Bougher SW, Blelly P-L, Combi M, Fox JL, Mueller-Wodarg I, Ridley A, Roble RGet al., 2008,

    , Publisher: SPRINGER, Pages: 107-141, ISSN: 0038-6308

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